UniHarp
Brand: PicoQuant | Category: Nanotechnology
UniHarp is PicoQuant's free universal time-tagging data acquisition software for real time, high precision photon data acquisition, visualisation and first pass analysis. Complex measurements can be configured without scripting, and live results can be compared directly against previously recorded data. Auto-Tune adjusts key acquisition settings automatically from the detected signal, Curve Memory anchors or loads earlier curves for direct comparison with live data, and a customisable Scoreboard window keeps the essential acquisition metrics continuously in view. Built in filtering tools help clean measurement data.
Manufacturer-listed software compatibility
| Parameter | Value |
|---|---|
| Operating systems | Windows 10 / 11 |
| Supported TCSPC modules | HydraHarp 500, PicoHarp 330, MultiHarp 150/160; TimeHarp 260 with optional DLLs |
| Supported channels | 1–64, depending on hardware |
| Measurement classes | Histogram, time trace, correlation, unfold and raw |
| Export formats | PTU, PHU and ASCII |
| Display | Linear or logarithmic, with zoom |
uniHarp datasheet, January 2026, page 5. Supported channel counts depend on the connected hardware; confirm drivers, optional libraries and software version. Checked 2026-09-29.
Manufacturer reference document (opens in a new tab)
Confirm your configuration
Share the details you know so we can prepare a comparable, itemised offer.
- Installed instrument/controller and software version to be supported
- Required analysis modules, licence term, number of users and data export
- Computer requirements, installation, training and update/support entitlement
Get a Quote
Request an itemised quotation covering the proposed configuration, availability, lead time and agreed supply and support scope.
Useful details to share
- Materials, sample dimensions and process or measurement goal
- Required performance and existing instrument interfaces
Share what you know. You can start with your name and a phone number or email; final specifications can follow.
Not sure which configuration you need? Help me choose
Contact Vvon Technologies Limited about PicoQuant equipment requirements in Bangladesh.
Phone: +8801805987890 | Email: info@vvon.com.bd
More from Instrument Software
- CompleteEASE Software
CompleteEASE is J.A. Woollam's data acquisition and model development environment for ellipsometry, described by the company as the culmination of 35 years of ellipsometry experience and software development that began in the 1980s. It handles versatile measurements including automated sample mapping and spectroscopic ellipsometry, with recipe creation for automated collection and analysis and a scan pattern editor working in cartesian or polar coordinates. Modelling tools include a thickness pre-fit algorithm, standard grid and randomised global fitting, an alternate models test covering surface roughness, grading and anisotropy, a B-Spline layer for semi-absorbing materials and a General Oscillator (Gen-Osc) layer, with regression by an optimised Levenberg-Marquardt routine that works with multi-core processors. Pattern recognition and deskew, Mueller matrix measurement and decomposition, and in-situ real time monitoring with a multi-time-slice analysis mode are also provided.
- SymPhoTime 64
SymPhoTime 64 is PicoQuant's integrated platform for time-resolved fluorescence imaging and analysis, pairing structured workflows with acquisition and processing tools. On the imaging side it unifies FLIM, FRET, anisotropy and multichannel imaging with decay fitting and IRF reconvolution. Its correlation engine covers FCS, FCCS, FLCS and antibunching analysis, and single molecule interfaces handle blinking, burst analysis, lifetime traces and PIE-FRET studies. The software controls PicoQuant microscope systems, the LSM Upgrade Kit, time tagging and TCSPC electronics and custom setups, with synchronised multi-mode imaging, real time previews and STUPSLANG scripting for tailored analysis routines and hardware extensions.
- WVASE Software
WVASE is J.A. Woollam's ellipsometric analysis programme, which the company describes as the most powerful and comprehensive available. Beyond ellipsometric data it also handles reflectance, transmission and neutron reflectivity data for thin film characterisation. Its generalised oscillator layer offers built in Lorentz, Gaussian, Harmonic, Drude, Tauc-Lorentz, Cody-Lorentz, Tanguy and PSEMI functions. The Meta-6 layer supports metamaterials with up to four constitutive functions, handles anisotropic structures requiring 3×3 tensors, and works with generalised ellipsometry and Mueller matrix ellipsometry measurements.