AR Maps
Brand: Oxford Instruments | Category: Nanotechnology
An analysis package for AFM data that reads both Ergo and Igor files from Jupiter family instruments. The standard level provides extensive tools to correct, normalise and denoise measured data, characterises surface and section data with ISO standard roughness, step height and distance measurement and histograms, and lets users build their own processing recipes. The advanced level adds batch processing and automation, statistics reports across datasets, critical dimension and trench analysis with cantilever tip deconvolution, image stitching and particle analysis.
Published software capabilities
| Parameter | Value |
|---|---|
| Supported data | Ergo and Igor files |
| Surface analysis | Roughness, step height, distances and histograms |
| Advanced options | Batch processing, image stitching and particle analysis |
Selected manufacturer data for the named configuration. Optical, detector and sample-environment options are ordered separately unless included in the quotation. Measurement results depend on the sample, selected components and operating conditions. Checked 2026-09-29.
Confirm your configuration
Share the details you know so we can prepare a comparable, itemised offer.
- Installed instrument/controller and software version to be supported
- Required analysis modules, licence term, number of users and data export
- Computer requirements, installation, training and update/support entitlement
Get a Quote
Request an itemised quotation covering the proposed configuration, availability, lead time and agreed supply and support scope.
Useful details to share
- Materials, sample dimensions and process or measurement goal
- Required performance and existing instrument interfaces
Share what you know. You can start with your name and a phone number or email; final specifications can follow.
Not sure which configuration you need? Help me choose
Contact Vvon Technologies Limited about Oxford Instruments equipment requirements in Bangladesh.
Phone: +8801805987890 | Email: info@vvon.com.bd
More from Instrument Software
- Solis Software
Solis is Andor's control programme for its cameras and spectrographs, supplied as a 32-bit and fully 64-bit Windows application with extensive data acquisition and export options. AndorBasic adds a macro language for control of acquisition, processing, display and export. Three variants are published: Solis I for image capture and analysis, Solis S tailored to spectroscopy acquisition, and Solis T for time-resolved work with control of the iStar camera range.
- Ergo AFM Software
The advanced software platform included with Asylum Research Cypher and Jupiter atomic force microscopes. GetReal technology calibrates the cantilever automatically each time and the AUTOPILOT algorithm works out the optimal imaging settings, while AFM images can be analysed inside Ergo without moving to another package. Scanning Capacitance Microscopy and Conductive AFM are supported for high resolution, high sensitivity nanoelectrical data, and advanced modes hand over to Asylum's IGOR Pro based software. Ergo Advanced Automation and Ergo KPFM are available as extensions.
- Oi View
Oi View is the Oxford Instruments NanoAnalysis digital platform that connects a laboratory's systems to a web service, so users can follow live analyses, system health and utilisation from anywhere. Health and utilisation reports compare system productivity and flag actions that keep a system in good condition, while Oi Library gives a curated view of the latest Oxford Instruments documentation. My Consultations records the outcome of discussions with Oxford Instruments application experts and shares them with other Oi View users. Connection needs AZtec version 6.1 or newer, an internet connection on the system, and agreement to the telemetry terms in Assist.