Ergo AFM Software
Brand: Oxford Instruments | Category: Nanotechnology
The advanced software platform included with Asylum Research Cypher and Jupiter atomic force microscopes. GetReal technology calibrates the cantilever automatically each time and the AUTOPILOT algorithm works out the optimal imaging settings, while AFM images can be analysed inside Ergo without moving to another package. Scanning Capacitance Microscopy and Conductive AFM are supported for high resolution, high sensitivity nanoelectrical data, and advanced modes hand over to Asylum's IGOR Pro based software. Ergo Advanced Automation and Ergo KPFM are available as extensions.
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