Brand: Oxford Instruments | Category: Nanotechnology

AZtecFeature is the Oxford Instruments particle analysis package for the SEM. The current release includes the FeatureExpress upgrade, which raises throughput while holding accuracy for the range of particle analysis applications the software is used for.
| Parameter | Value |
|---|---|
| Specification | Includes the FeatureExpress upgrade for higher throughput particle analysis |
Request an itemised quotation covering the proposed configuration, availability, lead time and agreed supply and support scope.
Share what you know. You can start with your name and a phone number or email; final specifications can follow.
Not sure which configuration you need? Help me choose
Contact Vvon Technologies Limited about Oxford Instruments equipment requirements in Bangladesh.
Phone: +8801805987890 | Email: info@vvon.com.bd
AZtec3D provides an interface that starts simultaneous energy dispersive X-ray and electron backscatter diffraction acquisition and analysis from outside AZtec. This lets the analysis be driven by automated processes such as FIB-SEM milling through a 3D software module.
LayerProbe is a thin film analysis option for the AZtec energy dispersive X-ray system. It characterises multiple layers beneath the specimen surface without destroying the sample, offering higher resolution than dedicated thin film measurement tools at lower cost.
AZtecFlex is a personal copy of AZtec for offline work. It lets users open and process their own data away from the microscope, covering energy dispersive X-ray, wavelength dispersive X-ray and electron backscatter diffraction datasets, and try advanced features.