CMOS NA-TKD Screen
Brand: Oxford Instruments | Category: Nanotechnology
The Near Axis Transmission Kikuchi Diffraction screen is an angled screen positioned close to the axis of the transmitted beam. Used with the Oxford Instruments CMOS EBSD detectors it raises sensitivity, allowing lower probe current and better spatial resolution.
Technical Specifications
| Parameter | Value |
|---|---|
| Specification | Angled screen optimised for transmission Kikuchi diffraction |
| Specification | Compatible with all Oxford Instruments CMOS EBSD detectors |
| Specification | Supplied as a kit with an optimised sample holder and screen changing equipment |
| Specification | Increased spatial resolution through reduced probe current |
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