EDU-AFM1 Educational Atomic Force Microscope
Brand: ThorLabs | Category: Scientific & Laboratory Equipment
A build-it-yourself atomic force microscope for teaching laboratories, imaging in constant height, constant force and lateral force modes. Optical disc samples and a calibration microstructure are supplied so students can compare known surfaces.
Technical Specifications
| Parameter | Value |
|---|---|
| Scan area | 0.05 micrometres square minimum to 20 micrometres square maximum |
| Sampled pixels per line | 50, 100, 250 or 500; scan speed 1 to 200 pixels per second |
| Typical distinguishable feature size | about 10 nm |
| Modes | constant force, constant height, lateral force and force-distance curves |
| Feedback | XY closed-loop piezo stage with strain gauge reader |
| Laser | 635 nm, 0.01 to 2.5 mW; ten aluminium coated cantilevers included |
Get a Quote
Request an itemised quotation covering the proposed configuration, availability, lead time and agreed supply and support scope.
Useful details to share
- Intended application, process or teaching activity
- Required capability and equipment it must work with
Share what you know. You can start with your name and a phone number or email; final specifications can follow.
Not sure which configuration you need? Help me choose
Contact Vvon Technologies Limited about ThorLabs equipment requirements in Bangladesh.
Phone: +8801805987890 | Email: info@vvon.com.bd
Back to Scientific & Laboratory Equipment
More from Microscopy & Imaging Systems
- 3D Visualization Software Hitachi map 3D
Hitachi map 3D builds a three dimensional model from the four signals of the segmented backscattered electron detector, with no sample tilting and no manual collection of consecutive images. It measures height, area, volume and ISO compliant surface roughness, and produces reports.
- EDU-OMC1 Optical Microscopy Course Educational Kit
A full undergraduate course in optical microscopy, in which students build and operate a modular microscope on an open rail. Ten lab units cover image formation, resolution, aberrations, contrast methods and fluorescence.
- Automated Material Identification and Classification System (AMICS)
AMICS automates mineral and material phase classification on Hitachi SEM platforms. It runs large area mapping and places energy dispersive spectrometry points automatically, then classifies the spectra to produce quantified mineral or material maps for mining and materials work.