Brand: Hitachi High-Tech | Category: Scientific & Laboratory Equipment

Hitachi map 3D builds a three dimensional model from the four signals of the segmented backscattered electron detector, with no sample tilting and no manual collection of consecutive images. It measures height, area, volume and ISO compliant surface roughness, and produces reports.
| Parameter | Value |
|---|---|
| Detectable angle range | ±60° reference |
| Detectable angle range on TM4000 | ±50° reference |
| Specification | Measures distance in X and Y, length, angle, surface area and volume between two points |
| Specification | Simple profile and surface roughness measurement with baseline, levelling and multiple offsets |
| Report and image output | PDF, RTF, PNG, JPG, GIF, TIF, BMP, EMF |
| 3D image and movie output | SUR, 3MF, STL, WRL, TXT, X3D, WMV, AVI |
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Contact Vvon Technologies Limited about Hitachi High-Tech equipment requirements in Bangladesh.
Phone: +8801805987890 | Email: info@vvon.com.bd
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AMICS automates mineral and material phase classification on Hitachi SEM platforms. It runs large area mapping and places energy dispersive spectrometry points automatically, then classifies the spectra to produce quantified mineral or material maps for mining and materials work.
A build-it-yourself atomic force microscope for teaching laboratories, imaging in constant height, constant force and lateral force modes. Optical disc samples and a calibration microstructure are supplied so students can compare known surfaces.
The AFM100 Series is the Hitachi probe microscopy platform, made up of the AFM100 and AFM100 Plus. It covers contact, dynamic force, phase, friction and sampling intelligent scan modes, and can operate in air, in liquid and at raised temperature.