Multifunctional Probe Microscopy Platform AFM100 series
Brand: Hitachi High-Tech | Category: Scientific & Laboratory Equipment
The AFM100 Series is the Hitachi probe microscopy platform, made up of the AFM100 and AFM100 Plus. It covers contact, dynamic force, phase, friction and sampling intelligent scan modes, and can operate in air, in liquid and at raised temperature.
Technical Specifications
| Parameter | Value |
|---|---|
| RMS noise level | 0.03 nm or less, in-plane drift 0.03 nm/sec or less |
| Sample size | max 35 mm diameter, 10 mm thick, optionally 50 mm square and 20 mm thick |
| Scanner ranges | XY 20 µm with Z 1.5 µm, XY 100 µm with Z 15 µm, XY 150 µm with Z 5 µm |
| Detection | optical lever with super luminescent diode light source |
| Measurement environment | atmosphere, in liquid, heated to 250 °C, heated in liquid to 60 °C |
| Modes | AFM, DFM, PM, FFM, SIS shapes and properties, Q value control |
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Phone: +8801805987890 | Email: info@vvon.com.bd
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