Jupiter Discovery AFM
Brand: Oxford Instruments | Category: Nanotechnology
A large sample research AFM that pairs best in class performance with a workflow built for everyday use. Ultra high resolution is held at scan rates 5 to 20 times faster than other AFMs. Pre-mounted probes, a side view camera and the exclusive FFM Topography imaging mode with Autopilot cut the setup work before a measurement, and the system is configurable across a wide range of research needs.
Selected manufacturer specifications
| Parameter | Value |
|---|---|
| Optional PolyHeater | Sample heating up to 300 °C |
| Optional high-voltage operation | Up to ±150 V |
| Standard basic modes | Contact, tapping, fast force mapping topography and force curves |
Selected manufacturer data for the named configuration. Optical, detector and sample-environment options are ordered separately unless included in the quotation. Measurement results depend on the sample, selected components and operating conditions. Checked 2026-09-29.
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