NaioAFM
Brand: Nanosurf | Category: Nanotechnology
An all-in-one entry level AFM for teaching and basic research on small samples, combining scan head, controller, XY table, airflow shielding and vibration isolation in one unit. No laser alignment is needed, so a first measurement can be made within minutes of unpacking.
Technical Specifications
| Parameter | Value |
|---|---|
| Configuration | scan head on a vibration isolation platform with integrated controller |
| Cantilever exchange | alignment chip, no laser or detector adjustment required |
| Sample observation | integrated camera for top and side view |
| Connection | plug into a PC and power up, no system setup |
| Modes | static, dynamic and phase imaging, MFM, C-AFM, EFM, force spectroscopy, force mapping, lithography |
Get a Quote
Request an itemised quotation covering the proposed configuration, availability, lead time and agreed supply and support scope.
Useful details to share
- Materials, sample dimensions and process or measurement goal
- Required performance and existing instrument interfaces
Share what you know. You can start with your name and a phone number or email; final specifications can follow.
Not sure which configuration you need? Help me choose
Contact Vvon Technologies Limited about Nanosurf equipment requirements in Bangladesh.
Phone: +8801805987890 | Email: info@vvon.com.bd
More from Atomic Force & Scanning Probe Microscopy
- NaioSTM
A tabletop scanning tunnelling microscope with scan head and controller in one instrument, widely used for teaching. The very short mechanical loop gives enough stability to reach atomic resolution on HOPG in an ordinary classroom, and tips are simply cut from Pt/Ir wire.
- Flex-Mount
The FlexAFM research scan head in a mountable form, made to be attached to a large motorised translation stage or to a customer stage. The tip-scanning design keeps performance on samples whose weight and size would defeat a sample-scanning instrument, including curved parts.
- Industrial AFM Solutions
Bespoke AFM systems engineered around a customer sample and measurement requirement, using mountable FlexAFM or DriveAFM scan heads on purpose-built stages. They are used for sub-nanometre characterisation of polished concave and convex glass, large optics and production quality control.