Brand: Nanosurf | Category: Nanotechnology

The FlexAFM research scan head in a mountable form, made to be attached to a large motorised translation stage or to a customer stage. The tip-scanning design keeps performance on samples whose weight and size would defeat a sample-scanning instrument, including curved parts.
| Parameter | Value |
|---|---|
| Scan range | 100 um |
| Controller | 24-bit controller |
| Scanner | flexure-based tip scanner |
| Cantilever mounting | self-aligning cantilevers |
| Sample observation | top and side view camera |
| Specification | Modes include C-AFM, SSRM, PFM, EFM, KPFM, SMM, MFM, EC-AFM, SThM |
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Contact Vvon Technologies Limited about Nanosurf equipment requirements in Bangladesh.
Phone: +8801805987890 | Email: info@vvon.com.bd
An all-in-one entry level AFM for teaching and basic research on small samples, combining scan head, controller, XY table, airflow shielding and vibration isolation in one unit. No laser alignment is needed, so a first measurement can be made within minutes of unpacking.
One of the smallest AFM scan heads Nanosurf builds, made to be integrated into custom stages, production lines or existing setups. It measures sub-nanometre surface roughness on workpieces that cannot be cut down, including concave and curved surfaces.
A tabletop scanning tunnelling microscope with scan head and controller in one instrument, widely used for teaching. The very short mechanical loop gives enough stability to reach atomic resolution on HOPG in an ordinary classroom, and tips are simply cut from Pt/Ir wire.