Brand: Nanosurf | Category: Nanotechnology

One of the smallest AFM scan heads Nanosurf builds, made to be integrated into custom stages, production lines or existing setups. It measures sub-nanometre surface roughness on workpieces that cannot be cut down, including concave and curved surfaces.
| Parameter | Value |
|---|---|
| Scan head size | less than 48 x 87 x 61 mm |
| Sample size | no inherent limit, suited to concave surfaces |
| Sample observation | integrated top and side view camera |
| Software | C3000 control software with scripting interface |
| Modes | static, dynamic and phase imaging, C-AFM, EFM, MFM, force spectroscopy |
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Contact Vvon Technologies Limited about Nanosurf equipment requirements in Bangladesh.
Phone: +8801805987890 | Email: info@vvon.com.bd
The FlexAFM research scan head in a mountable form, made to be attached to a large motorised translation stage or to a customer stage. The tip-scanning design keeps performance on samples whose weight and size would defeat a sample-scanning instrument, including curved parts.
An AFM that mounts on the objective turret of an upright optical microscope or 3D profilometer, so a region found optically can be measured at nanometre resolution by rotating the turret. It returns 3D topography and can also map electrical, magnetic and mechanical properties.
An all-in-one entry level AFM for teaching and basic research on small samples, combining scan head, controller, XY table, airflow shielding and vibration isolation in one unit. No laser alignment is needed, so a first measurement can be made within minutes of unpacking.