Brand: Nanosurf | Category: Nanotechnology

An AFM that mounts on the objective turret of an upright optical microscope or 3D profilometer, so a region found optically can be measured at nanometre resolution by rotating the turret. It returns 3D topography and can also map electrical, magnetic and mechanical properties.
| Parameter | Value |
|---|---|
| Mounting | objective turret of an optical microscope or 3D optical profilometer |
| Kinematic mounting repeatability | better than 10 um |
| Cantilever exchange repeatability | tip within 4 um of the same position |
| Integrated optics | 8x objective lens |
| Specification | Adapters available for Zeiss, Olympus, Leica, Nikon and Mitutoyo turrets |
| Modes | static, lateral, dynamic and phase imaging, C-AFM, EFM, MFM, force spectroscopy |
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Contact Vvon Technologies Limited about Nanosurf equipment requirements in Bangladesh.
Phone: +8801805987890 | Email: info@vvon.com.bd
One of the smallest AFM scan heads Nanosurf builds, made to be integrated into custom stages, production lines or existing setups. It measures sub-nanometre surface roughness on workpieces that cannot be cut down, including concave and curved surfaces.
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