IR-VASE Mark II Ellipsometer
Brand: J.A. Woollam | Category: Nanotechnology
The IR-VASE Mark II joins the chemical sensitivity of FTIR spectroscopy to spectroscopic ellipsometry across 1.7 to 30 microns. It gives n and k over the whole measured range without Kramers Kronig extrapolation, and needs no vacuum or reference sample, so liquid and solid interfaces can be studied.
Technical Specifications
| Parameter | Value |
|---|---|
| Ellipsometer configuration | RCE |
| Wavelength range | 1.7 um to 30 um, 333 to 5900 cm-1 |
| Resolution | 1 cm-1 to 64 cm-1, user defined |
| Detector | DTGS |
| Angles of incidence | 32 to 90 degrees |
| Data acquisition rate | 1 to 30 minutes typical for one angle of incidence at 16 cm-1 resolution |
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Contact Vvon Technologies Limited about J.A. Woollam equipment requirements in Bangladesh.
Phone: +8801805987890 | Email: info@vvon.com.bd
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