VUV-VASE Ellipsometer
Brand: J.A. Woollam | Category: Nanotechnology
The VUV-VASE measures from the vacuum ultraviolet to the near infrared and is used for optical characterisation of lithography thin films, high bandgap materials and immersion fluids. Placing the monochromator before the sample limits exposure of photosensitive materials during measurement.
Technical Specifications
| Parameter | Value |
|---|---|
| Ellipsometer configuration | rotating analyser ellipsometry with AutoRetarder and monochromator |
| Wavelength range | 146 to 1100 nm standard, XNIR option adds 1100 to 2500 nm |
| Angles of incidence, Gen-II | 10 to 90 degrees below 315 nm, 20 to 90 degrees above 315 nm |
| Data acquisition rate | 1 to 3 seconds per wavelength typical, 20 to 30 seconds for high accuracy |
| Light source | deuterium and xenon lamps |
| Software | WVASE for acquisition, analysis and optical simulation |
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Contact Vvon Technologies Limited about J.A. Woollam equipment requirements in Bangladesh.
Phone: +8801805987890 | Email: info@vvon.com.bd
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