alpha 2.0 Ellipsometer
Brand: J.A. Woollam | Category: Nanotechnology
The alpha 2.0 is the entry level benchtop spectroscopic ellipsometer for routine thickness and refractive index measurement. Place the sample, choose a model and press measure, and results follow in seconds. It suits single layer dielectrics, self assembled monolayers, organics and coatings on glass.
Technical Specifications
| Parameter | Value |
|---|---|
| Ellipsometer configuration | dual rotation optical design |
| Wavelength range | 400 to 1000 nm |
| Number of wavelengths | 190 |
| Angles of incidence | 65, 70, 75 degrees or 90 degrees straight through |
| Data acquisition rate | 5 to 10 seconds typical for the complete spectrum |
| Sample size | up to 200 mm diameter and 16 mm thick |
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Contact Vvon Technologies Limited about J.A. Woollam equipment requirements in Bangladesh.
Phone: +8801805987890 | Email: info@vvon.com.bd
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