theta-SE Ellipsometer
Brand: J.A. Woollam | Category: Nanotechnology
The theta-SE is a benchtop mapping ellipsometer for checking thin film uniformity across wafers up to 300 mm. A patented dual theta rotation stage, focused beam and camera alignment keep the footprint close to the wafer size while producing thickness and optical constant maps.
Technical Specifications
| Parameter | Value |
|---|---|
| Mapping coverage | 300 mm diameter |
| Spectral range | 400 to 1000 nm |
| Number of wavelengths | 190 |
| Spot size | nominal 250 x 600 um on sample |
| Angle of incidence | 65 degrees fixed for all measurements |
| Data acquisition rate | 0.61 seconds fastest, 1 to 2 seconds typical |
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Contact Vvon Technologies Limited about J.A. Woollam equipment requirements in Bangladesh.
Phone: +8801805987890 | Email: info@vvon.com.bd
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