M-2000 Ellipsometer
Brand: J.A. Woollam | Category: Nanotechnology
The M-2000 is a rotating compensator ellipsometer that collects hundreds of wavelengths at once with CCD detection. Modular optics let it sit on a table top base or attach to a process chamber, so the same instrument covers in situ monitoring, large area mapping and general thin film characterisation.
Technical Specifications
| Parameter | Value |
|---|---|
| Ellipsometer configuration | rotating compensator ellipsometer (RCE) |
| Spectral range | 193 to 1000 nm in the D configuration, NIR option adds 1005 to 1690 nm |
| Number of wavelengths | about 500 in the D configuration |
| Angles of incidence | 45 to 90 degrees automated angle base, 20 to 90 degrees vertical automated angle base |
| Data acquisition rate | 0.05 seconds minimum, 2 to 5 seconds typical for the complete spectrum |
| Maximum substrate thickness | 18 mm |
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Contact Vvon Technologies Limited about J.A. Woollam equipment requirements in Bangladesh.
Phone: +8801805987890 | Email: info@vvon.com.bd
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