RC2 Ellipsometer
Brand: J.A. Woollam | Category: Nanotechnology
The RC2 uses two synchronously rotating compensators and was the first commercial spectroscopic ellipsometer to collect all 16 elements of the Mueller matrix. That makes it suited to anisotropic materials, liquid crystals and nanostructures as well as ordinary thin film work.
Technical Specifications
| Parameter | Value |
|---|---|
| Ellipsometer configuration | dual rotating compensator (dual RCE) |
| Wavelength range | 193 to 1000 nm in the D configuration, XNIR option adds 1005 to 2500 nm |
| Number of wavelengths | about 800 in the D configuration |
| Angles of incidence | 45 to 90 degrees automated angle base, 20 to 90 degrees vertical automated angle base |
| Data acquisition rate | 0.3 seconds minimum, 2 to 10 seconds typical for the complete spectrum |
| Maximum substrate thickness | 18 mm |
Get a Quote
Request an itemised quotation covering the proposed configuration, availability, lead time and agreed supply and support scope.
Useful details to share
- Materials, sample dimensions and process or measurement goal
- Required performance and existing instrument interfaces
Share what you know. You can start with your name and a phone number or email; final specifications can follow.
Not sure which configuration you need? Help me choose
Contact Vvon Technologies Limited about J.A. Woollam equipment requirements in Bangladesh.
Phone: +8801805987890 | Email: info@vvon.com.bd
More from Ellipsometry & Thin Film Metrology
- VASE Ellipsometer
The VASE is the established variable angle research ellipsometer, using a rotating analyser with the AutoRetarder and a custom scanning monochromator. A vertical sample mount supports reflection, transmission and scattering geometries on semiconductors, dielectrics, polymers, metals and multilayers.
- M-2000 Ellipsometer
The M-2000 is a rotating compensator ellipsometer that collects hundreds of wavelengths at once with CCD detection. Modular optics let it sit on a table top base or attach to a process chamber, so the same instrument covers in situ monitoring, large area mapping and general thin film characterisation.
- IR-VASE Mark II Ellipsometer
The IR-VASE Mark II joins the chemical sensitivity of FTIR spectroscopy to spectroscopic ellipsometry across 1.7 to 30 microns. It gives n and k over the whole measured range without Kramers Kronig extrapolation, and needs no vacuum or reference sample, so liquid and solid interfaces can be studied.