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Jandel Hand Applied Probe

Brand: Jandel Engineering | Category: Nanotechnology

Jandel Hand Applied Probe

The Hand Applied Probe rests directly on the sample rather than being held above it, which avoids the reading drift seen with fully handheld methods. It measures thin layers, wafers and large ingots, but the strong downward force rules out fragile unsupported samples.

Technical Specifications

ParameterValue
SpecificationProbe head loads up to 200 g per needle
SpecificationDownward force of around 1.2 kg to compress the needles fully
SpecificationMeasures thin layers and wafers up to large ingots
SpecificationNot suitable for fragile unsupported samples

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Contact Vvon Technologies Limited about Jandel Engineering equipment requirements in Bangladesh.

Phone: +8801805987890 | Email: info@vvon.com.bd

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