Brand: Jandel Engineering | Category: Nanotechnology

The Hand Applied Probe rests directly on the sample rather than being held above it, which avoids the reading drift seen with fully handheld methods. It measures thin layers, wafers and large ingots, but the strong downward force rules out fragile unsupported samples.
| Parameter | Value |
|---|---|
| Specification | Probe head loads up to 200 g per needle |
| Specification | Downward force of around 1.2 kg to compress the needles fully |
| Specification | Measures thin layers and wafers up to large ingots |
| Specification | Not suitable for fragile unsupported samples |
Request an itemised quotation covering the proposed configuration, availability, lead time and agreed supply and support scope.
Share what you know. You can start with your name and a phone number or email; final specifications can follow.
Not sure which configuration you need? Help me choose
Contact Vvon Technologies Limited about Jandel Engineering equipment requirements in Bangladesh.
Phone: +8801805987890 | Email: info@vvon.com.bd
The cylindrical four point probe head fits Jandel probe stands, some OEM mapping systems and equipment made by Four Dimensions. The plain cylindrical body also suits customers building their own probe mount, and a mounting adapter is offered.
The Universal Probe Station handles both four point probe and three point spreading resistance measurements. All four needles are adjustable for load and can be replaced by the user, and an X-Y stage gives fine movement for targeting small samples.
The Compact Probe is made for Veeco FPP5000 and FPP100 equipment and also fits GRQ tools. It replaces the square bodied probe heads originally made by Alessi. Some Veeco tools take the cartridge with lead instead, so the tool should be confirmed before ordering.