Brand: Jandel Engineering | Category: Nanotechnology

This version of the Multiheight stand adds a micrometer controlled X-Y stage for small samples. Four screws release the stage, so the same stand returns to handling large wafers and ingots without further adjustment.
| Parameter | Value |
|---|---|
| Specification | Measures sample sizes from several mm square up to 300 mm |
| Specification | X-Y microposition table removes with four screws |
| Specification | Accommodates large samples up to 300 mm diameter |
| Specification | Accommodates ingots up to 250 mm thick, thicker on request |
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Phone: +8801805987890 | Email: info@vvon.com.bd
The Multiposition Probe Stand is built for wafer measurement, with indexed rotation and linear travel that return the probe to the same points run after run. Two sizes are offered at the same cost, the smaller one being easier for placing small wafers on the table.
The Multiheight Probe Stand raises and lowers the probe mechanism so samples from thin films to large ingots can be measured on one stand. It is Jandel's most popular stand and its base carries four mounting holes for accessories such as an eight inch wafer table.
The Microposition Probe Stand is for small samples and printed lines where the probe has to be placed accurately. Micrometer slides move the sample under the probe and the sample can also be rotated through a full turn.