Brand: Jandel Engineering | Category: Nanotechnology

The Microposition Probe Stand is for small samples and printed lines where the probe has to be placed accurately. Micrometer slides move the sample under the probe and the sample can also be rotated through a full turn.
| Parameter | Value |
|---|---|
| Maximum sample size | 76 mm |
| Micrometer movement | maximum 25 mm x 25 mm in 0.01 increments |
| Specification | 360 degree rotation of the sample |
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Contact Vvon Technologies Limited about Jandel Engineering equipment requirements in Bangladesh.
Phone: +8801805987890 | Email: info@vvon.com.bd
The Universal Probe Station handles both four point probe and three point spreading resistance measurements. All four needles are adjustable for load and can be replaced by the user, and an X-Y stage gives fine movement for targeting small samples.
The Multiposition Probe Stand is built for wafer measurement, with indexed rotation and linear travel that return the probe to the same points run after run. Two sizes are offered at the same cost, the smaller one being easier for placing small wafers on the table.
The Hand Applied Probe rests directly on the sample rather than being held above it, which avoids the reading drift seen with fully handheld methods. It measures thin layers, wafers and large ingots, but the strong downward force rules out fragile unsupported samples.