Jandel Portable Probing System
Brand: Jandel Engineering | Category: Nanotechnology
The Portable Probing System pairs the HM21 Test Unit with the Hand Applied Probe for measurements made away from a fixed stand. It handles thin layers, wafers and large ingots, but the high downward force means it is not suitable for fragile unsupported samples.
Technical Specifications
| Parameter | Value |
|---|---|
| Specification | Combination of the HM21 Test Unit and the Hand Applied Probe |
| Specification | Probe head loads up to 200 g per needle |
| Specification | Downward force of around 1.2 kg |
| Specification | Measures thin layers and wafers up to large ingots |
| Specification | Not suitable for fragile unsupported samples |
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Contact Vvon Technologies Limited about Jandel Engineering equipment requirements in Bangladesh.
Phone: +8801805987890 | Email: info@vvon.com.bd
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