Jandel Wafer Probing System
Brand: Jandel Engineering | Category: Nanotechnology
The Wafer Probing System pairs the RM3000+ Test Unit with the Multiposition Probe Stand for repeatable measurement across wafers. Indexed theta and linear movements return the probe to set points, which suits five point and nine point wafer uniformity routines.
Technical Specifications
| Parameter | Value |
|---|---|
| Specification | Combination of the RM3000+ Test Unit and the Multiposition Probe Stand |
| Specification | Available for wafers up to 150 mm or up to 200 mm diameter at the same cost |
| Specification | Theta movement clicks into four positions at 90 degrees |
| Specification | Linear movement in up to 10 positions |
| Repeat placement accuracy | +/-1 mm |
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Contact Vvon Technologies Limited about Jandel Engineering equipment requirements in Bangladesh.
Phone: +8801805987890 | Email: info@vvon.com.bd
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