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Jandel Multipurpose Four Point Probe System

Brand: Jandel Engineering | Category: Nanotechnology

Jandel Multipurpose Four Point Probe System

The Multipurpose System combines the Multiheight Probe Stand and RM3000+ Test Unit with a removable micrometer controlled X-Y table. Small samples such as coated glass slides can be positioned precisely, and with the table removed the stand takes wafers and ingots.

Technical Specifications

ParameterValue
SpecificationCombination of the Multiheight Probe Stand, RM3000+ Test Unit and removable X-Y microposition table
Maximum sample size on the micrometer controlled stage76 mm diameter
SpecificationBase available for samples up to 250 mm diameter, or 300 mm as an option
SpecificationAccommodates ingots up to 250 mm deep
SpecificationOptional longer post available for taller samples

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Contact Vvon Technologies Limited about Jandel Engineering equipment requirements in Bangladesh.

Phone: +8801805987890 | Email: info@vvon.com.bd

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