Brand: Jandel Engineering | Category: Nanotechnology

The Multipurpose System combines the Multiheight Probe Stand and RM3000+ Test Unit with a removable micrometer controlled X-Y table. Small samples such as coated glass slides can be positioned precisely, and with the table removed the stand takes wafers and ingots.
| Parameter | Value |
|---|---|
| Specification | Combination of the Multiheight Probe Stand, RM3000+ Test Unit and removable X-Y microposition table |
| Maximum sample size on the micrometer controlled stage | 76 mm diameter |
| Specification | Base available for samples up to 250 mm diameter, or 300 mm as an option |
| Specification | Accommodates ingots up to 250 mm deep |
| Specification | Optional longer post available for taller samples |
Request an itemised quotation covering the proposed configuration, availability, lead time and agreed supply and support scope.
Share what you know. You can start with your name and a phone number or email; final specifications can follow.
Not sure which configuration you need? Help me choose
Contact Vvon Technologies Limited about Jandel Engineering equipment requirements in Bangladesh.
Phone: +8801805987890 | Email: info@vvon.com.bd
The Wafer Probing System pairs the RM3000+ Test Unit with the Multiposition Probe Stand for repeatable measurement across wafers. Indexed theta and linear movements return the probe to set points, which suits five point and nine point wafer uniformity routines.
The General Purpose System pairs the RM3000+ Test Unit with the Multiheight Probe Stand and is the combination Jandel sells most. The adjustable probe height takes samples from thin layers and wafers up to ingots 250 mm high, with thicker samples accommodated on request.
The Portable Probing System pairs the HM21 Test Unit with the Hand Applied Probe for measurements made away from a fixed stand. It handles thin layers, wafers and large ingots, but the high downward force means it is not suitable for fragile unsupported samples.