Jandel General Purpose System
Brand: Jandel Engineering | Category: Nanotechnology
The General Purpose System pairs the RM3000+ Test Unit with the Multiheight Probe Stand and is the combination Jandel sells most. The adjustable probe height takes samples from thin layers and wafers up to ingots 250 mm high, with thicker samples accommodated on request.
Technical Specifications
| Parameter | Value |
|---|---|
| Specification | Combination of the RM3000+ Test Unit and the Multiheight Probe Stand |
| Specification | Measures thin layers and wafers up to ingots 250 mm high |
| Specification | Thicker samples can be accommodated on request |
| Specification | Lever operated probe with switched current leads to prevent sparking |
Get a Quote
Request an itemised quotation covering the proposed configuration, availability, lead time and agreed supply and support scope.
Useful details to share
- Materials, sample dimensions and process or measurement goal
- Required performance and existing instrument interfaces
Share what you know. You can start with your name and a phone number or email; final specifications can follow.
Not sure which configuration you need? Help me choose
Contact Vvon Technologies Limited about Jandel Engineering equipment requirements in Bangladesh.
Phone: +8801805987890 | Email: info@vvon.com.bd
More from Electrical & Electrochemical Characterisation
- Jandel Multipurpose Four Point Probe System
The Multipurpose System combines the Multiheight Probe Stand and RM3000+ Test Unit with a removable micrometer controlled X-Y table. Small samples such as coated glass slides can be positioned precisely, and with the table removed the stand takes wafers and ingots.
- PS-HM-8425 Hall measurement package for the CRX-VF probe station
The PS-HM-8425 package adds Hall measurement to Lake Shore's CRX-VF cryogenic probe station. It supports DC Hall measurements on wafer-scale materials and structures as a function of temperature and field, and is supplied with a switch matrix, current source, voltmeter and a PC running the 8400 Series HMS software. Van der Pauw, Hall bar and gated Hall bar measurements are all covered, with optional modules for extra probe arms, high resistance work, gate bias voltage and QMSA software.
- Jandel Wafer Probing System
The Wafer Probing System pairs the RM3000+ Test Unit with the Multiposition Probe Stand for repeatable measurement across wafers. Indexed theta and linear movements return the probe to set points, which suits five point and nine point wafer uniformity routines.