LSR L33
Brand: Linseis | Category: Nanotechnology
The LSR L33, formerly the LSR-3, measures the Seebeck coefficient and the electrical conductivity of solids and thin films. The sample is clamped vertically between two electrodes and interchangeable furnaces cover -100 C to 1500 C. It is used to characterise thermoelectric materials.
Technical Specifications
| Parameter | Value |
|---|---|
| Temperature range | infrared furnace RT up to 800 C/1100 C, resistance furnace RT up to 1500 C, low temperature furnace -100 C to 500 C |
| Measurement method | Seebeck coefficient static DC method / slope method, electrical resistance four-point measurement |
| Measuring range Seebeck coefficient | 1 uV/K to 5000 uV/K (static direct current method), accuracy +/-7 % / repeatability +/-3.5 % |
| Sample size (cylinder or rectangle) | 2 to 5 mm base area and max. 23 mm long |
| Sample size round (disc shape) | 10, 12.7, 25.4 mm |
| Atmosphere | inert, reducing, oxidising, vacuum |
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