Brand: Linseis | Category: Nanotechnology

The LZT L32, also published as the LZT-Meter, combines an LSR and an LFA in one instrument, so thermal conductivity, electrical resistance and the Seebeck coefficient are measured on the same sample. These values give the thermoelectric figure of merit ZT. Interchangeable furnaces cover -100 C to 1100 C.
| Parameter | Value |
|---|---|
| Temperature range | infrared furnace RT up to 800 C/1100 C, low temperature furnace -100 C to 500 C |
| Measurement method | Seebeck coefficient static DC method / slope method, electrical resistance four-point measurement |
| Measuring range Seebeck coefficient | 1 uV/K to 250 mV/K (static DC method), accuracy +/-7 % / repeatability +/-3.5 % |
| Sample size (cylinder or rectangle) | 2 to 5 mm base area and max. 23 mm long |
| Sample size round (disc shape) | 10, 12.7, 25.4 mm |
| Atmosphere | inert, reducing, oxidising, vacuum |
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Phone: +8801805987890 | Email: info@vvon.com.bd
The LSR L33, formerly the LSR-3, measures the Seebeck coefficient and the electrical conductivity of solids and thin films. The sample is clamped vertically between two electrodes and interchangeable furnaces cover -100 C to 1500 C. It is used to characterise thermoelectric materials.
The TIM L58 measures the thermal resistance of thermal interface materials under realistic contact pressure. Sample thickness and applied force are varied to reproduce assembly conditions, with evaluation routines to ASTM D5470. It is used in electronics, battery and thermal management work.
The LSR L31, formerly the LSR-1, characterises thermoelectric materials as bulk samples and thin films. It measures the Seebeck coefficient and the specific electrical resistance, with a cryo option down to -160 C. The sample sits on an integrated PCB board with two heaters.