PTIQ
Brand: Oxford Instruments | Category: Nanotechnology
PTIQ is the next generation control software for Oxford Instruments plasma systems, built for the PlasmaPro, Atomfab and Ionfab platforms in both research laboratories and volume production. It logs process data at millisecond accuracy with 1,000-point logging, offers visual proactive readiness indicators, and provides calibration, fault finding and device fingerprinting tools alongside fully programmable multi-cassette load and unload scheduling. The interface is SEMI E95 compliant, touchscreen compatible for cleanroom and yellow-light areas, and supports multi-user profiles for operators, engineers and maintenance teams. Optional modules extend it further, including DiagnostIQs for advanced diagnostics, calibration and predictive maintenance, and a Web API with CSV recipe run data export.
Published software capabilities
| Parameter | Value |
|---|---|
| Listed platforms | PlasmaPro, Atomfab and Ionfab |
| Optional diagnostics | DiagnostIQs |
| Optional log analysis | AnalytIQs |
| Factory integration option | SECS/GEM |
Selected manufacturer data for the named configuration. Optical, detector and sample-environment options are ordered separately unless included in the quotation. Measurement results depend on the sample, selected components and operating conditions. Checked 2026-09-29.
Confirm your configuration
Share the details you know so we can prepare a comparable, itemised offer.
- Installed instrument/controller and software version to be supported
- Required analysis modules, licence term, number of users and data export
- Computer requirements, installation, training and update/support entitlement
Get a Quote
Request an itemised quotation covering the proposed configuration, availability, lead time and agreed supply and support scope.
Useful details to share
- Materials, sample dimensions and process or measurement goal
- Required performance and existing instrument interfaces
Share what you know. You can start with your name and a phone number or email; final specifications can follow.
Not sure which configuration you need? Help me choose
Contact Vvon Technologies Limited about Oxford Instruments equipment requirements in Bangladesh.
Phone: +8801805987890 | Email: info@vvon.com.bd
More from Instrument Software
- WinNormos-for-Igor Software Package with WinSite and WinDist
WinNormos-for-Igor tackles almost all the common problems met in Mossbauer spectroscopy, bringing the old DOS Normos Site and Dist routines together in one package that runs inside the Igor graphing and analysis programme from WaveMetrics. All Mossbauer isotopes can be selected at run time, most of them predefined, and the static Hamiltonian is solved exactly for any isotope, with true transmission integral fits and automatic folding for triangular or sinusoidal velocity. WinSite treats a discrete set of subspectra while WinDist handles distributions in hyperfine field, quadrupole splitting or isomer shift, including correlation effects, Gaussian and Voigt distribution profiles and polarised source experiments with spin texture evaluation. Velocity calibration can be taken from WissEl laser drive files, workspaces are stored and recovered as Igor experiments with all numerical results, and reports can be generated automatically in Rich Text Format.
- Oi View
Oi View is the Oxford Instruments NanoAnalysis digital platform that connects a laboratory's systems to a web service, so users can follow live analyses, system health and utilisation from anywhere. Health and utilisation reports compare system productivity and flag actions that keep a system in good condition, while Oi Library gives a curated view of the latest Oxford Instruments documentation. My Consultations records the outcome of discussions with Oxford Instruments application experts and shares them with other Oi View users. Connection needs AZtec version 6.1 or newer, an internet connection on the system, and agreement to the telemetry terms in Assist.
- WiRE Correlate module
Correlate lets Raman results be compared against images from many other microscopy systems, among them scanning electron microscopy (SEM), fluorescence, atomic force microscopy (AFM), infra-red and optical microscopes. You record the coordinates of three or more reference points and data acquisition points on the sample, and the module then guides you back to the same regions of interest once the sample has been transferred between microscopes. A Coordinate Manager imports and transforms coordinates from commonly used microscopy systems, while an Image Alignment Tool gives translation, rotation, sizing and aspect ratio control for overlay at variable transparency. Batch measurements automate the same Raman measurement at different positions on a sample.