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RISE Raman-SEM Microscope

Brand: Oxford Instruments | Category: Nanotechnology

RISE Raman-SEM Microscope

Published by Oxford Instruments as the world's first fully integrated Raman imaging and scanning electron microscope, bringing every feature of a stand-alone SEM and of the confocal witec360 Raman microscope into one instrument. Switching between the Raman and SEM measurement positions is quick and the sample transfer between them is automated, so results correlate and images overlay directly. Diffraction limited lateral resolution is 200 to 300 nm, three dimensional images and depth profiles are supported, and an ultra-fast Raman imaging option brings integration time down to 0.76 ms per spectrum. A RISE-EDS configuration adds Raman-SEM-EDS in the same instrument.

Selected manufacturer specifications

ParameterValue
Raman lateral resolution200–300 nm; optical configuration dependent
Optional Raman acquisitionIntegration time down to 0.76 ms per spectrum
Sample transferAutomated transfer within the SEM vacuum chamber

Selected manufacturer data for the named configuration. Optical, detector and sample-environment options are ordered separately unless included in the quotation. Measurement results depend on the sample, selected components and operating conditions. Checked 2026-09-29.

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