Scanning Electron Microscopes SU3800/SU3900
Brand: Hitachi High-Tech | Category: Scientific & Laboratory Equipment
The SU3800 and SU3900 are variable pressure scanning electron microscopes with a five axis motorised stage and automated functions. The SU3900 carries a larger multipurpose chamber that takes specimens up to 300 mm diameter for bulky industrial samples.
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Match the SEM configuration to your specimens
Compare the SU3800/SU3900 family against your sample dimensions, imaging requirements and analytical detectors. Request the exact configuration and a demonstration with representative samples.
Nanotechnology RFQ checklist (TXT)
- Provide specimen materials, dimensions, preparation methods and the smallest features that need to be resolved.
- Separate SEM imaging from EDS or EBSD requirements and confirm detector, stage, port and software compatibility.
- Agree site utilities, installation, acceptance measurements, training and support in the written proposal.
Microscopy and microanalysis catalogue: Compare microscopes, detectors and sample preparation.
EDS detector buying guide: Plan detector compatibility and analytical requirements.
Technical Specifications
| Parameter | Value |
|---|---|
| Secondary electron resolution | 3.0 nm at 30 kV, WD 5 mm, high vacuum mode |
| Backscattered electron resolution | 4.0 nm at 30 kV, WD 5 mm, low vacuum mode |
| Accelerating voltage | 0.3 kV to 30 kV |
| Magnification | 5x to 300,000x image ratio |
| Low vacuum mode setting | 6 to 650 Pa |
| Maximum specimen size | 200 mm diameter SU3800, 300 mm diameter SU3900 |
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Contact Vvon Technologies Limited about Hitachi High-Tech equipment requirements in Bangladesh.
Phone: +8801805987890 | Email: info@vvon.com.bd
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