Scanning Electron Microscope FlexSEM 1000 II
Brand: Hitachi High-Tech | Category: Scientific & Laboratory Equipment
The FlexSEM 1000 II is a variable pressure scanning electron microscope with a tungsten filament source. It images uncoated and outgassing samples in a controlled pressure chamber, and supports energy dispersive X-ray analysis and STEM specimen holders.
Technical Specifications
| Parameter | Value |
|---|---|
| Secondary electron resolution | 4.0 nm at 20 kV, WD 5 mm, high vacuum mode |
| Backscattered electron resolution | 5.0 nm at 20 kV, WD 5 mm, VP mode |
| Accelerating voltage | 0.3 kV to 20 kV |
| Magnification | 6x to 300,000x image ratio |
| Variable pressure range | 6 to 100 Pa in 13 steps |
| Maximum observable range | 64 mm diameter combined with rotation |
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