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Symmetry S3

Brand: Oxford Instruments | Category: Nanotechnology

Symmetry S3

Symmetry S3 is an all in one electron backscatter diffraction detector built on a CMOS sensor with lens free fibre optic coupling. It combines high indexing speed with the sensitivity needed for low energy and low current work, and the detector tilt is controlled from software.

Plan your specification

Specify both fast mapping and detailed patterns for Symmetry S3

Symmetry S3 combines a fast 156 × 128-pixel mode with full 1244 × 1024-pixel patterns. Define which measurements need each mode before comparing the complete system.

Mapping conditions
Oxford lists more than 5700 patterns/s at 156 × 128 pixels. Request a demonstration on representative specimens with beam conditions, indexing results and pattern settings recorded; full-resolution patterns are a separate mode.
Detector and SEM geometry
The detector has software-controlled tilt. Provide the SEM model, chamber ports, sample size and existing EDS arrangement so the proposed mounting and usable geometry can be confirmed.
Acquisition and analysis scope
Identify the required grain, phase or specialised strain outputs. Ask which software, data-storage hardware, licences, training and acceptance measurements are included.

Product documentation

Discuss this configuration

Read the EBSD detector selection guide

Technical Specifications

ParameterValue
Indexing speedin excess of 5700 pps at 156 x 128 pixel pattern resolution
Full pattern resolution1244 x 1024 pixels for high angular resolution EBSD
SpecificationUnique fibre optic coupling with sub-pixel distortion
SpecificationSoftware controlled detector tilting
SpecificationProximity sensor to avoid stage collisions

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Not sure which configuration you need? Help me choose

Contact Vvon Technologies Limited about Oxford Instruments equipment requirements in Bangladesh.

Phone: +8801805987890 | Email: info@vvon.com.bd

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