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C-Swift+

Brand: Oxford Instruments | Category: Nanotechnology

C-Swift+

C-Swift+ is a high speed entry level electron backscatter diffraction detector for routine materials analysis and high throughput characterisation. It uses a customised CMOS sensor with fibre optics, and can trade speed for pattern quality on complex multi phase samples.

Plan your specification

Compare C-Swift+ throughput at a usable pattern quality

C-Swift+ offers fast mapping and a higher-resolution pattern mode. Select the operating mode around the routine specimen types and the phase detail the laboratory needs.

Fast versus detailed acquisition
Oxford lists more than 2000 patterns/s at 156 × 128 pixels and 622 × 512-pixel patterns at up to 250 patterns/s. Compare the actual acquisition quality and time at the appropriate mode for your specimens.
Multiphase measurements
State which phases must be distinguished and whether simultaneous EDS is required. Ask for relevant pattern examples and confirm the compatible software and phase information used in the demonstration.
Complete mapping workflow
Provide the SEM, specimen and stage details for an integration review. Confirm detector clearance, map data handling, analysis options and acceptance evidence for the expected workload.

Product documentation

Discuss this configuration

Read the EBSD detector selection guide

Technical Specifications

ParameterValue
Indexing speed guaranteedgreater than 2000 pps using only 8 nA beam current
Pattern resolution at maximum speed156 x 128 pixels
Specification622 x 512 pixel patterns at speeds up to 250 pps
Angular precisionbelow 0.05°
SpecificationOptional integrated forescatter detectors

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Not sure which configuration you need? Help me choose

Contact Vvon Technologies Limited about Oxford Instruments equipment requirements in Bangladesh.

Phone: +8801805987890 | Email: info@vvon.com.bd

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