Brand: Oxford Instruments | Category: Nanotechnology

C-Swift+ is a high speed entry level electron backscatter diffraction detector for routine materials analysis and high throughput characterisation. It uses a customised CMOS sensor with fibre optics, and can trade speed for pattern quality on complex multi phase samples.
Plan your specification
C-Swift+ offers fast mapping and a higher-resolution pattern mode. Select the operating mode around the routine specimen types and the phase detail the laboratory needs.
| Parameter | Value |
|---|---|
| Indexing speed guaranteed | greater than 2000 pps using only 8 nA beam current |
| Pattern resolution at maximum speed | 156 x 128 pixels |
| Specification | 622 x 512 pixel patterns at speeds up to 250 pps |
| Angular precision | below 0.05° |
| Specification | Optional integrated forescatter detectors |
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Contact Vvon Technologies Limited about Oxford Instruments equipment requirements in Bangladesh.
Phone: +8801805987890 | Email: info@vvon.com.bd
OmniProbe nanomanipulators are used for lift out work in FIB and SEM systems, mainly TEM lamella preparation. The ninth generation units run on piezoelectric motors under closed loop control, and the port mounted design keeps clear of other detectors and accessories.
C-Nano+ is an entry level electron backscatter diffraction detector using a customised CMOS sensor. Its high pixel resolution suits detailed strain analysis, and the lens free fibre optic design gives the sensitivity needed for beam sensitive and nanocrystalline materials.
The cryo lift out option extends OmniProbe lift out to cryogenic samples, including those made by high pressure freezing. A custom probe shaft with a thermally isolated tip is cooled passively from the cryo system cold finger, opening up cryo-TEM and cryo atom probe work.