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C-Nano+

Brand: Oxford Instruments | Category: Nanotechnology

C-Nano+

C-Nano+ is an entry level electron backscatter diffraction detector using a customised CMOS sensor. Its high pixel resolution suits detailed strain analysis, and the lens free fibre optic design gives the sensitivity needed for beam sensitive and nanocrystalline materials.

Plan your specification

Match C-Nano+ pattern detail to the research question

C-Nano+ offers full 1244 × 1024-pixel patterns and a faster 311 × 256-pixel mode. Evaluate the detail your analysis needs alongside the available SEM beam conditions.

Useful pattern resolution
Specify whether the workload is routine orientation mapping or needs detailed pattern analysis. Ask to compare full-resolution data with the 311 × 256-pixel mode, for which Oxford lists 600 patterns/s.
Sample and beam compatibility
Share the material, smallest relevant features and any beam-sensitivity concerns. Evaluate representative prepared samples rather than inferring achievable resolution or sensitivity from detector pixels alone.
Microscope interface and data workflow
Confirm the mounting, detector clearance and existing EDS integration. Include acquisition and analysis licences, raw-pattern storage, data export and method-specific training in the quotation.

Product documentation

Discuss this configuration

Read the EBSD detector selection guide

Technical Specifications

ParameterValue
Indexing speed guaranteed600 pps using only 3 nA beam current
Pattern resolution at maximum speed311 x 256 pixels
Full resolution patterns1244 x 1024 pixels for high resolution EBSD
Maximum sensitivity900 pps per nA in full resolution mode
SpecificationGuaranteed sub-pixel distortion giving angular precision better than 0.05°

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Not sure which configuration you need? Help me choose

Contact Vvon Technologies Limited about Oxford Instruments equipment requirements in Bangladesh.

Phone: +8801805987890 | Email: info@vvon.com.bd

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