Brand: Oxford Instruments | Category: Nanotechnology

C-Nano+ is an entry level electron backscatter diffraction detector using a customised CMOS sensor. Its high pixel resolution suits detailed strain analysis, and the lens free fibre optic design gives the sensitivity needed for beam sensitive and nanocrystalline materials.
Plan your specification
C-Nano+ offers full 1244 × 1024-pixel patterns and a faster 311 × 256-pixel mode. Evaluate the detail your analysis needs alongside the available SEM beam conditions.
| Parameter | Value |
|---|---|
| Indexing speed guaranteed | 600 pps using only 3 nA beam current |
| Pattern resolution at maximum speed | 311 x 256 pixels |
| Full resolution patterns | 1244 x 1024 pixels for high resolution EBSD |
| Maximum sensitivity | 900 pps per nA in full resolution mode |
| Specification | Guaranteed sub-pixel distortion giving angular precision better than 0.05° |
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Contact Vvon Technologies Limited about Oxford Instruments equipment requirements in Bangladesh.
Phone: +8801805987890 | Email: info@vvon.com.bd
C-Swift+ is a high speed entry level electron backscatter diffraction detector for routine materials analysis and high throughput characterisation. It uses a customised CMOS sensor with fibre optics, and can trade speed for pattern quality on complex multi phase samples.
Symmetry S3 is an all in one electron backscatter diffraction detector built on a CMOS sensor with lens free fibre optic coupling. It combines high indexing speed with the sensitivity needed for low energy and low current work, and the detector tilt is controlled from software.
OmniProbe nanomanipulators are used for lift out work in FIB and SEM systems, mainly TEM lamella preparation. The ninth generation units run on piezoelectric motors under closed loop control, and the port mounted design keeps clear of other detectors and accessories.