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TM Series Energy Dispersive X-ray Spectrometer: Quantax75

Brand: Hitachi High-Tech | Category: Nanotechnology

TM Series Energy Dispersive X-ray Spectrometer: Quantax75

Quantax75 is one of the EDS systems Hitachi offer with the TM4000 series tabletop microscopes, using a built-in detector made by Bruker Nano GmbH. Hitachi note that every detector in this range is of compact design and needs no liquid nitrogen. The system gives local spectra observation at specified points, high speed colourised X-ray mapping, a hypermap function that returns spot analysis, line analysis and mapping results from a single acquisition, and live deconvolution so that overlapping peaks are separated and mapped in real time.

Selected manufacturer specifications

ParameterValue
Detector typeSilicon drift detector (SDD)
Detector area30 mm²
Energy resolution at Cu Kα148 eV
Equivalent resolution at Mn Kα129 eV or less, as specified by Hitachi
Element rangeBoron (B, 5) to californium (Cf, 98)
CoolingLiquid nitrogen not required

Hitachi QUANTAX75 data for the TM-series EDS option. Cu Kα and equivalent Mn Kα figures are different reference conditions; confirm the exact microscope and installed detector/software configuration. Checked 2026-09-29.

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