TM Series Energy Dispersive X-ray Spectrometer: Element series
Brand: Hitachi High-Tech | Category: Nanotechnology
The Element series are EDX systems for Hitachi's TM series tabletop microscopes, produced by EDAX Instruments. A Si3N4 detector window optimises low energy X-ray transmission for light element analysis, which Hitachi say improves mapping speed and detection limits over a conventional detector window, and a hexagonal support grid raises transmission further. APEX software supplies multi user logins, user configurable windows, customisable reporting, simplified automation, fast mapping, simultaneous collection and review, and spectrum match libraries. The sample configuration shown is in combination with a TM4000 series instrument.
Manufacturer-listed EDS configuration
| Parameter | Value |
|---|---|
| Detector | EDAX silicon drift detector |
| Detector window | Silicon nitride (Si₃N₄) |
| Software platform | APEX |
| Analysis tools | Element mapping and spectrum-library comparison |
| User management | Multiple-user support |
These are the manufacturer-listed Element-series features. Detector area, energy resolution and the supported TM microscope revision must be confirmed for the quoted package. Checked 2026-09-29.
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