Xplore TEM
Brand: Oxford Instruments | Category: Nanotechnology
Xplore TEM is the Oxford Instruments silicon drift detector aimed at routine work on 120kV and 200kV transmission electron microscopes. It combines an 80 mm2 sensor with a polymer thin window and Extreme electronics for fast, accurate elemental characterisation. The SATW window keeps the detector straightforward to use, and element coverage runs from beryllium to californium.
Selected manufacturer specifications
| Parameter | Value |
|---|---|
| Sensor active area | 80 mm² |
| Published solid-angle range | 0.1–0.4 sr; microscope geometry dependent |
| Detector window | Polymer thin window |
Selected manufacturer data for the named configuration. Optical, detector and sample-environment options are ordered separately unless included in the quotation. Measurement results depend on the sample, selected components and operating conditions. Checked 2026-09-29.
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