Ultim Max TEM
Brand: Oxford Instruments | Category: Nanotechnology
Ultim Max TEM is the Oxford Instruments silicon drift detector for nanoscale analysis and elemental mapping in the TEM. A low profile 80 mm2 sensor sits closer to the specimen and so collects more X-ray counts under any condition, and combined with windowless construction and Extreme electronics it delivers high performance EDS for 200kV instruments. An increased solid angle and take off angle reduce shadowing by bulky in situ holders, which supports mapping of samples in gas or liquid cells.
Selected manufacturer specifications
| Parameter | Value |
|---|---|
| Sensor active area | 80 mm² |
| Published solid-angle range | 0.2–0.6 sr; microscope geometry dependent |
| Detector window | Windowless |
Selected manufacturer data for the named configuration. Optical, detector and sample-environment options are ordered separately unless included in the quotation. Measurement results depend on the sample, selected components and operating conditions. Checked 2026-09-29.
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