Ultim Max TLE
Brand: Oxford Instruments | Category: Nanotechnology
Ultim Max TLE is the Oxford Instruments flagship silicon drift detector for the TEM, optimised for elemental characterisation at the atomic scale with maximum count rates at the smallest probe sizes. Its performance comes from an optimised sensor shape, a 100 mm2 sensor, windowless construction, an optimised mechanical design and Extreme electronics. The detector is also aimed at biological sample analysis, where it collects data quickly and accurately on beam sensitive samples by maximising the count rate of low energy X-rays. Extreme electronics combined with the X4 pulse processor allow in situ EDS mapping and quantification at elevated temperatures.
Selected manufacturer specifications
| Parameter | Value |
|---|---|
| Sensor active area | 100 mm² |
| Published solid-angle range | 0.5–1.1 sr; microscope geometry dependent |
| Detector window | Windowless |
Selected manufacturer data for the named configuration. Optical, detector and sample-environment options are ordered separately unless included in the quotation. Measurement results depend on the sample, selected components and operating conditions. Checked 2026-09-29.
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