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Vero ES Interferometric AFM

Brand: Oxford Instruments | Category: Nanotechnology

Vero ES Interferometric AFM

The environmental control configuration of the Vero AFM line, measuring true tip displacement by Quadrature Phase Differential Interferometry (QPDI). Detection noise falls by up to ten times on many cantilevers and imaging runs 10 to 100 times faster than typical AFMs. Sample temperature options cover 0 to 250 C where heating alone is needed, or 0 to 120 C where both heating and cooling are required.

Selected manufacturer specifications

ParameterValue
DetectionQuadrature Phase Differential Interferometry (QPDI)
Heating optionUp to 250 °C
Separate heater–cooler option0–120 °C
EnvironmentSealed gas or liquid sample cell

Selected manufacturer data for the named configuration. Optical, detector and sample-environment options are ordered separately unless included in the quotation. Measurement results depend on the sample, selected components and operating conditions. Checked 2026-09-29.

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