Brand: Oxford Instruments | Category: Nanotechnology

AZtecCrystal 4.0 is the Oxford Instruments electron backscatter diffraction data processing package, first released in 2019 and developed since for high speed detectors. It adds dislocation analysis, parent grain reconstruction and MapSweeper pattern matching reanalysis.
| Parameter | Value |
|---|---|
| Specification | Dislocation analysis |
| Specification | Parent grain reconstruction |
| Specification | MapSweeper dataset reanalysis using pattern matching |
| Specification | Designed for the data volumes produced by high speed EBSD detectors |
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AZtecSynergy collects energy dispersive X-ray and electron backscatter diffraction data at the same time. The tools for integrated acquisition sit in one place, so there is no switching between navigators during a run, and phase selection and calibration are handled together.
AZtecHKL is the Oxford Instruments electron backscatter diffraction acquisition software. It carries out data collection and analysis in real time, drives the Symmetry S3 detector, and is set up for nanoscale orientation mapping by transmission Kikuchi diffraction.
AZtecTEM is the Oxford Instruments energy dispersive X-ray software written for transmission electron microscopy. It takes a system level approach to characterising materials at the nanoscale, building on the company's long standing work in TEM detector technology.