AZtecSynergy
Brand: Oxford Instruments | Category: Nanotechnology
AZtecSynergy collects energy dispersive X-ray and electron backscatter diffraction data at the same time. The tools for integrated acquisition sit in one place, so there is no switching between navigators during a run, and phase selection and calibration are handled together.
Technical Specifications
| Parameter | Value |
|---|---|
| Specification | Simultaneous EDS and EBSD data collection |
| Specification | Several navigators available in one interface |
| Specification | Phase selection and dual image capture |
| Specification | AutoCalibration |
Get a Quote
Request an itemised quotation covering the proposed configuration, availability, lead time and agreed supply and support scope.
Useful details to share
- Materials, sample dimensions and process or measurement goal
- Required performance and existing instrument interfaces
Share what you know. You can start with your name and a phone number or email; final specifications can follow.
Not sure which configuration you need? Help me choose
Contact Vvon Technologies Limited about Oxford Instruments equipment requirements in Bangladesh.
Phone: +8801805987890 | Email: info@vvon.com.bd
More from Instrument Software
- AZtecTEM
AZtecTEM is the Oxford Instruments energy dispersive X-ray software written for transmission electron microscopy. It takes a system level approach to characterising materials at the nanoscale, building on the company's long standing work in TEM detector technology.
- AZtecCrystal 4.0
AZtecCrystal 4.0 is the Oxford Instruments electron backscatter diffraction data processing package, first released in 2019 and developed since for high speed detectors. It adds dislocation analysis, parent grain reconstruction and MapSweeper pattern matching reanalysis.
- AZtec LayerProbe
LayerProbe is a thin film analysis option for the AZtec energy dispersive X-ray system. It characterises multiple layers beneath the specimen surface without destroying the sample, offering higher resolution than dedicated thin film measurement tools at lower cost.