Brand: Oxford Instruments | Category: Nanotechnology

AZtecTEM is the Oxford Instruments energy dispersive X-ray software written for transmission electron microscopy. It takes a system level approach to characterising materials at the nanoscale, building on the company's long standing work in TEM detector technology.
| Parameter | Value |
|---|---|
| Application | EDS acquisition and analysis in TEM |
| Drift correction | AutoLock predictive and reactive correction |
| Analysis tools | Tru-Q quantification, TruMap and TruLine correction |
Selected manufacturer data for the named configuration. Optical, detector and sample-environment options are ordered separately unless included in the quotation. Measurement results depend on the sample, selected components and operating conditions. Checked 2026-09-29.
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LayerProbe is a thin film analysis option for the AZtec energy dispersive X-ray system. It characterises multiple layers beneath the specimen surface without destroying the sample, offering higher resolution than dedicated thin film measurement tools at lower cost.
AZtecSynergy collects energy dispersive X-ray and electron backscatter diffraction data at the same time. The tools for integrated acquisition sit in one place, so there is no switching between navigators during a run, and phase selection and calibration are handled together.
AZtecFeature is the Oxford Instruments particle analysis package for the SEM. The current release includes the FeatureExpress upgrade, which raises throughput while holding accuracy for the range of particle analysis applications the software is used for.