Brand: Oxford Instruments | Category: Nanotechnology

The CMOS EBSD IR Screen lets electron backscatter diffraction run during in situ heating experiments. It blocks the infrared radiation emitted by a hot sample that would otherwise saturate the detector, without the loss of sensitivity caused by coating the phosphor screen.
| Parameter | Value |
|---|---|
| Specification | Allows EBSD analysis in combination with heating stages |
| Specification | Same EBSD detector performance during heating as at room temperature |
| Specification | No compromise in room temperature performance from the IR filtering |
| Specification | Compatible with the Oxford Instruments CMOS EBSD detector range |
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The EDS IR Filter allows energy dispersive X-ray analysis during in situ heating in the SEM. It uses a light material to block infrared radiation from the hot sample while still passing low energy X-rays, and is fitted only for heating work so room temperature analysis is unaffected.
Sealed metallic retorts that give a chamber furnace a controlled inert or reactive atmosphere. The A105 uses a silicone rubber seal and reaches lower oxygen levels than the sand sealed A107, and can be run with the hydrogen safety system.
The Near Axis Transmission Kikuchi Diffraction screen is an angled screen positioned close to the axis of the transmitted beam. Used with the Oxford Instruments CMOS EBSD detectors it raises sensitivity, allowing lower probe current and better spatial resolution.