Brand: Oxford Instruments | Category: Nanotechnology

The Horizon 10k Ion Polisher uses an argon plasma to etch and prepare flat and cross sectional samples for microscopy. A cooling stage limits thermal damage, and recipe based operation with simple sample mounting keeps preparation repeatable on soft and difficult materials.
| Parameter | Value |
|---|---|
| Milling speed | 1,000 µm/h on silicon at 8 kV |
| Specification | Cooling stage to minimise thermal damage |
| Specification | Flat milling function for planar etching |
| Specification | Fast pump and vent time with easy sample loading |
| Specification | Uses argon plasma for both flat and cross sectional preparation |
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Now in its ninth generation, this nanomanipulator applies piezo actuation to nanoscale positioning in the FIB and SEM, offering four degrees of freedom in X, Y, Z and R with 4 mm or more of working distance. Nanometre-resolution piezo actuators paired with 10 nm closed-loop encoders deliver precision, linearity and smooth motion, and closed loop control lets the operator navigate to stored positions and move orthogonally at any sample tilt. Motorised concentric rotation and in situ tip changes come as standard, so probe needles can be swapped in under 3 minutes without venting the microscope. Insertion and retraction are non-pneumatic, which is gentle on fragile samples.
An interface that brings Raman, photoluminescence and cathodoluminescence analysis into a scanning electron microscope chamber. The sample stays still between SEM imaging and Raman collection, so the two data sets are co-located, and the probe retracts with a single click.
The cryo lift out option extends OmniProbe lift out to cryogenic samples, including those made by high pressure freezing. A custom probe shaft with a thermally isolated tip is cooled passively from the cryo system cold finger, opening up cryo-TEM and cryo atom probe work.