LFA L52
Brand: Linseis | Category: Nanotechnology
The LFA L52 is a high-power laser flash analyser for thermophysical properties such as thermal diffusivity and thermal conductivity. A laser pulse heats the sample and the transient response is recorded at 2.5 MHz. Measurements run in inert, reducing or oxidising atmospheres, or under vacuum.
Technical Specifications
| Parameter | Value |
|---|---|
| Data acquisition rate | 2.5 MHz |
| Atmosphere control | inert, reducing or oxidising |
| Vacuum | down to 10-5 mbar |
| Multi-sample measurement | up to 18 samples |
| Evaluation models | 2-layer and 3-layer, Cowan 5 and 10 |
Get a Quote
Request an itemised quotation covering the proposed configuration, availability, lead time and agreed supply and support scope.
Useful details to share
- Materials, sample dimensions and process or measurement goal
- Required performance and existing instrument interfaces
Share what you know. You can start with your name and a phone number or email; final specifications can follow.
Not sure which configuration you need? Help me choose
Contact Vvon Technologies Limited about Linseis equipment requirements in Bangladesh.
Phone: +8801805987890 | Email: info@vvon.com.bd
More from Thermal Analysis & Thermophysical Measurement
- TF-LFA L54
The TF-LFA L54 is a laser flash analyser for thin films. Linseis states measurement of thermal conductivity in the range of 80 nm to 20 um, at temperatures from room temperature up to 500 C. An anisotropy option gives in-plane and cross-plane values on multilayer and 2D materials.
- LFA L51
The LFA L51 is a light flash analyser for thermal diffusivity, thermal conductivity and specific heat. A software-controlled light flash heats the sample and the temperature response is captured at 2.5 MHz, which suits thin or highly conductive materials. Linseis states measurements to +1250 C.
- PLH L53
The PLH L53 uses periodic laser heating to determine the thermal diffusivity of thin samples. It covers a diffusivity range of 0.01 to 2000 mm2/s on sample thicknesses of 10 to 500 um, using a continuous wave diode laser. It is used to characterise films, foils and small specimens.