Brand: Lake Shore | Category: Nanotechnology

The MeasureReady 155 is a precision low noise AC and DC current and voltage source. It sources voltage from 10 mV to 100 V and current from 1 µA to 100 mA, with manual or automatic range selection. It is used to drive samples and devices in low level electrical measurements.
| Parameter | Value |
|---|---|
| Voltage source ranges | 10 mV, 100 mV, 1 V, 10 V and 100 V |
| Current source ranges | 1 µA to 100 mA with 10 V compliance, 1 µA to 10 mA with 100 V compliance |
| Voltage source resolution | 100 nV on the 10 mV range |
| Current source resolution | 10 pA on the 1 µA range |
| Output selection modes | voltage or current, with manual or autorange range selection |
| Current source compliance selection | 10 V or 100 V |
Request an itemised quotation covering the proposed configuration, availability, lead time and agreed supply and support scope.
Share what you know. You can start with your name and a phone number or email; final specifications can follow.
Not sure which configuration you need? Help me choose
Contact Vvon Technologies Limited about Lake Shore equipment requirements in Bangladesh.
Phone: +8801805987890 | Email: info@vvon.com.bd
InAs and GaAs Hall sensors are supplied as bare sensing elements in axial and transverse packages for measuring magnetic flux density. Types range from general purpose parts to instrumentation quality sensors with low temperature coefficients. They are used with Lake Shore 400 Series gaussmeters.
The FWPX is a cryogenic probe station for full wafer testing, taking wafers up to 102 mm (4 in) in diameter and able to be modified for 152 mm (6 in) wafers. A 2-stage flow cryostat cooled by liquid helium or liquid nitrogen gives a base temperature of 4.5 K with control up to 475 K.
Lake Shore 400 Series Hall probes hold a Hall sensing element in a protective stem so magnetic flux density can be measured with a gaussmeter. Several probe configurations and Hall sensor types are offered. They are used for field mapping, magnet inspection and routine field checks.