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Mechelle 5000 Spectrograph

Brand: Oxford Instruments | Category: Nanotechnology

Mechelle 5000 Spectrograph

The Mechelle ME5000 echelle spectrograph records a wide wavelength range from 200 to 975 nm simultaneously in a single acquisition. It has no moving components and is available in a pre-aligned detector and spectrometer format, with a patented optical design based on the echelle grating principle that gives extremely low crosstalk and high resolution. Automatic temperature correction compensates for the change in prism refractive index with temperature, and nitrogen purging maximises throughput in the ultraviolet. Andor Solis software extracts a fully wavelength calibrated spectrum from the complex echelle image and can label peaks against the NIST table.

Selected manufacturer specifications

ParameterValue
Simultaneous wavelength coverage200–975 nm in one acquisition
Optical arrangementEchelle, without moving components
Environmental featuresNitrogen purge and automatic temperature correction

Selected manufacturer data for the named configuration. Optical, detector and sample-environment options are ordered separately unless included in the quotation. Measurement results depend on the sample, selected components and operating conditions. Checked 2026-09-29.

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Contact Vvon Technologies Limited about Oxford Instruments equipment requirements in Bangladesh.

Phone: +8801805987890 | Email: info@vvon.com.bd

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