Brand: Hitachi High-Tech | Category: Scientific & Laboratory Equipment

The SU8600 is a cold field emission scanning electron microscope for ultrahigh resolution imaging. An upper detector with ExB filter mixes secondary and backscattered signals, and optional detectors add cathodoluminescence and STEM capability.
| Parameter | Value |
|---|---|
| Secondary electron resolution | 0.6 nm at 15 kV, 0.7 nm at 1 kV |
| Magnification | 20x to 2,000,000x |
| Electron gun | cold cathode field emission with anode heating system |
| Accelerating voltage | 0.5 kV to 30 kV |
| Landing voltage | 0.01 kV to 20 kV |
| Stage control | 5 axis motor drive |
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The SU8700 is a Schottky field emission scanning electron microscope offering high probe current for fast microanalysis alongside ultrahigh resolution imaging. Low landing voltage operation without stage bias suits beam sensitive specimens.
The SU7000 is a Schottky field emission scanning electron microscope that collects several secondary and backscattered signals at once. Up to six channels can be displayed and stored together, and an optional variable pressure mode widens the range of samples.
The SU9600 is the flagship Hitachi cold field emission scanning electron microscope, built for subnanometre observation. An in lens objective and ExB detection give good signal to noise at low probe current, for semiconductor devices and advanced materials.